MetMap Integrated Metrology for Precision Manufacturing is the first of two conferences being held as part of a road mapping project to define the future of integrated metrology in advanced manufacturing in the UK (https://nottingham.ac.uk/conference/fac-eng/metmap-2019).
MetMap defines integrated metrology as any measurement that is made in relation to the manufacture of a product. This is divided into the following sub-themes: in-process, off-line, on-machine, in-line and in-situ (defined on the project website).
Academic and industrial experts will present and promote key advances in precision manufacturing metrology and establish any additional critical requirements from UK industrial users and manufacturers. The conference will focus on four key themes: sen-sor development, process monitoring, process control and data handling. A number of keynote speakers will set the scene and review the future, and each session will consist of a state-of-the-art review and regular talks.
Committee
Richard Leach (Chair) University of Nottingham, Evangelos Chatzivagiannis Manufacturing Technology Centre, Ben Dutton Manufacturing Technology Centre, Simon Cavill Nuclear Advanced Manufacturing Research Centre, Carl Hitchens Nuclear Advanced Manufacturing Research Centre, Per Sanders National Composites Centre, Richard James Advanced Manufacturing Research Centre, Jon Stammers Advanced Manufacturing Research Centre, Emma Stokes Centre for Process Innovation, Alex Attridge Warwick Manufacturing Group, Daniel Mcmahon Advanced Forming Research Centre, Luke Todhunter University of Nottingham, Andrew Dickins University of Nottingham, Andrew Longstaff University of Huddersfield, Hassan Ghadbeigi University of Sheffield, Peter Kinnell Loughborough University, Claudiu Giusca Cranfield University, Alborz Shokrani University of Bath, David Butler National Physical Laboratory, Steff Smith Institute of Measurement and Control, Dishi Phillips euspen.
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