At the 30th Control International (www.control-messe.de) trade fair for quality assurance, Bruker has announced the release of the innovative and unique Contour CMM dimensional analysis system, which is the world’s first non-contact metrology system to perform simultaneous nanoscale surface height, texture, waviness and form measurements, as well as 3D coordinate measurements for geometric dimensioning and tolerancing (GD&T), all on one instrument. Leveraging decades of world-leading optical metrology innovation, the system performs rapid, non-contact precision measurements to meet the industry’s most stringent standards. The Contour CMM system enables more accurate and convenient metrology for R&D and manufacturing of small structures in precision-machined components across a wide range of industries, from medical devices and optics, to automotive and aerospace.
“Contour CMM is an exciting breakthrough in the marriage of high-resolution optical surface profiling and coordinate measurement,” said Donald K. Cohen, Ph.D., Managing Member at Michigan Metrology, LLC. “It will allow engineers and researchers to examine parts in a completely new way and develop data that has previously been impossible to generate. Designers and manufacturers of precision components will gain significant value from having this capability to accelerate development and increase the quality of their products.”
“The Contour CMM system is a new enabler that fills a technology gap that industry has desired to bridge for many years,” added James Earle, Vice President and General Manager of Bruker’s Tribology, Stylus and Optical Metrology Business. “Our customers have had to face the uncertainties that come from fusing data from multiple technologies to solve manufacturing problems or investigate materials. Now they can get all the detailed surface metrology they have come to rely upon from our systems, and also locate that data within the larger form for true, one-stop characterization."