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Carl Zeiss

X-ray microscopy solutions close the gap between light and electron microscopy. more

Jul 22, 2013 12:13 PM metrology

At the 2013 Control international trade fair for quality assurance, ZEISS presented its new Hardware Auto Focus and cleanroom kit for the proven Axio Imager Vario microscope system. more

May 14, 2013 4:23 PM metrology

On 6 February 2013, the microscopy business group of Carl Zeiss received second prize in the 2013 CLEAN! Fraunhofer Cleanliness Technology Award for its Correlative Particle Analyzer (CAPA). more

Feb 22, 2013 2:02 PM metrology

The Semiconductor Manufacturing Technology business group at Carl Zeiss and the German national metrology institute PTB will be expanding their cooperation in the future to include optics metrology for EUV lithography. more

Jan 15, 2013 4:53 PM metrology

Carl Zeiss and Synopsys have released a new data preparation output module for accurately measuring of critical dimensions (CD) in photomasks using the metrology tool WLCD. more

Nov 29, 2012 4:51 PM metrology

The "Lithography for the 22 nanometer node" project, led by Carl Zeiss, has been successfully completed. more

Nov 6, 2012 3:11 PM mems