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microscopes

Olympus’ MX63 and MX63L microscopes make large industrial sample inspection quick and easy. more

Aug 18, 2017 11:20 PM metrology

XY Stages from Prior Scientific for the new Olympus MX63 and MX63L Industrial Microscopes for inspection of semiconductors and flat panel displays (FPDs). more

Aug 3, 2017 12:32 PM metrology

A British nanotech invention has revolutionised the humble optical microscope by quadrupling its magnification power to a level far beyond what could previously be achieved with visible light. more

Jun 23, 2017 9:10 AM metrology

Bruker has announced that it has acquired Luxendo, a privately held spin-off of the European Molecular Biology Laboratory (EMBL) that develops and manufactures proprietary light-sheet fluorescence microscopy instruments. more

May 9, 2017 9:25 AM metrology

The Katana HP laser offers the capability to be externally triggered. more

Dec 14, 2016 9:59 AM 1 Comments

Olympus launches its Stream 2.2 image analysis software package, significantly improving reliability and precision in a range of materials science applications. more

Nov 18, 2016 11:03 AM metrology

Prior Scientific announces the H139, a new motorised microscope stage designed to enable life scientists to precisely position, move and image up to two microplates or nine microscope slides. more

Nov 4, 2016 11:23 AM metrology

This report gives users of stereo microscopes helpful advice when attempting to select optimal illumination or lighting systems for sample observation. more

May 19, 2016 3:58 PM metrology

Bruker Corporation and Digital Surf has announced that Bruker Nano Surfaces is offering Vision64 Map data analysis and reporting software with its 3D optical microscope systems, including Contour Elite, ContourGT, NPFLEX, and the new Contour CMM. more

Apr 11, 2016 10:53 AM metrology

Bruker’s Nano Surfaces Division has announced the release of the MultiMode 8-HR Atomic Force Microscope (AFM). more

Jan 13, 2016 4:15 PM metrology

Only offered in selected countries in Europe, the Leica DMS300 and Leica A60 are now available for a 15 day free trial at your lab. more

Oct 30, 2015 8:25 PM metrology

Olympus has launched its Series C industrial videoscope, delivering cost-effective, reliable and easy inspection of manufactured parts, structures and areas that have limited direct visual access, via exceptional manoeuvrability and articulation. more

Jun 30, 2015 2:35 PM metrology

Moving towards sustainable manufacture of photovoltaics, the latest technology in 3D laser scanning microscopy has enhanced the accuracy and efficiency of Dr M. Schiek’s research into organic semiconductors and transparent electrodes. more

Oct 31, 2014 2:14 PM articles

Nikon Metrology has launched a series of white light interferometry (WLI) systems, designated BW series that will set a new standard in 2D and 3D surface profiling. more

Oct 21, 2014 3:51 PM metrology

A JCM-6000 NeoScope benchtop scanning electron microscope (SEM) from Nikon Metrology was installed in February 2013 at Morgan Advanced Materials' Innovation Hub in the UK. more

Aug 8, 2014 12:13 PM articles

Bruker has announced it has recently been awarded its fourth patent for PeakForce Tapping, its proprietary atomic force microscopy mode. more

Jul 23, 2014 4:57 PM metrology

Bruker has announced the release of Inspire, the first integrated SPM infrared system for 10-nanometer spatial resolution in chemical and materials property mapping. more

Jul 11, 2014 10:31 AM metrology

At the 2013 Control international trade fair for quality assurance, ZEISS presented its new Hardware Auto Focus and cleanroom kit for the proven Axio Imager Vario microscope system. more

May 14, 2013 4:23 PM metrology

Vision Engineering’s will be demonstrating its new HD digital inspection system and its new handheld digital inspection magnifier at Southern Manufacturing 2013, as well exciting new updates to their range of measurement systems. more

Nov 2, 2012 10:13 AM metrology

Bruker has announced the launch of the ContourGT-I 3D Optical Microscope to enhance R&D productivity and maximise manufacturing throughput for industrial applications. more

Oct 30, 2012 12:13 PM metrology 1 Comments