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Olympus SE & Co. KG

XY Stages from Prior Scientific for the new Olympus MX63 and MX63L Industrial Microscopes for inspection of semiconductors and flat panel displays (FPDs). more

Aug 3, 2017 12:32 PM metrology

Olympus launches its Stream 2.2 image analysis software package, significantly improving reliability and precision in a range of materials science applications. more

Nov 18, 2016 11:03 AM metrology

We are now entering an era of flexible electronics, and one popular design approach for tolerating flexibility is to overlay rigid electronic components on a deformable substrate. more

Feb 8, 2016 5:37 PM articles

Sustainable energy sources are set to contribute increasingly towards our ever growing global demands. more

Oct 25, 2015 3:32 PM articles

Olympus has launched its Series C industrial videoscope, delivering cost-effective, reliable and easy inspection of manufactured parts, structures and areas that have limited direct visual access, via exceptional manoeuvrability and articulation. more

Jun 30, 2015 2:35 PM metrology

Visitors to this year’s EUSPEN will have the chance to discover the latest innovations in industrial inspection more

May 20, 2015 3:18 PM metrology

Moving towards sustainable manufacture of photovoltaics, the latest technology in 3D laser scanning microscopy has enhanced the accuracy and efficiency of Dr M. Schiek’s research into organic semiconductors and transparent electrodes. more

Oct 31, 2014 2:14 PM articles