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Bruker Corporation

LightSpeed focus variation technology provides fast, extremely accurate metrology more

metrology

Bruker has acquired Anasys Instruments Corp., a privately held company that develops and manufactures nanoscale infrared spectroscopy and thermal measurement instruments. more

metrology

Bruker has released the NanoMechanics Lab, a suite of force-mapping modes that enable Dimension FastScan and Icon AFM systems to perform quantitative nanoscale characterization, extending from soft hydrogels and polymers to stiff metals and ceramics. more

metrology

As part of the commitment to providing turn-key innovative solutions for the automotive industry, Bruker’s Nano Surfaces Division has announced the release of the Brake Material Screening Module. more

metrology

Manufacturers of MicroElectroMechanical Systems (MEMS) rely on trustable metrology systems to control their processes and to verify how their products will perform. more

metrology

At SEMICON West 2017, Bruker’s Semiconductor Division  today announced that leading multiple semiconductor manufacturers have ordered JVSensus-600E X-ray Diffraction Imaging Systems for in-line wafer monitoring of crystalline defects. more

electronics

Bruker has announced that it has acquired Luxendo, a privately held spin-off of the European Molecular Biology Laboratory (EMBL) that develops and manufactures proprietary light-sheet fluorescence microscopy instruments. more

metrology

Acquisition strengthens Bruker’s leading position in nanoanalysis and nanomechanical materials characterisation. more

metrology

Bruker’s Nano Surfaces Division and Cetim has announced that Bruker has delivered its Contour CMM Dimensional Analysis System to the Cetim Carnot Institute in France. more

metrology

At the 30th Control International trade fair for quality assurance, Bruker has announced the release of the innovative and unique Contour CMM dimensional analysis system. more

metrology

Bruker Corporation and Digital Surf has announced that Bruker Nano Surfaces is offering Vision64 Map data analysis and reporting software with its 3D optical microscope systems, including Contour Elite, ContourGT, NPFLEX, and the new Contour CMM. more

metrology

Bruker’s Nano Surfaces Division has announced the release of the MultiMode 8-HR Atomic Force Microscope (AFM). more

metrology

True high-definition imaging combined with ultra-precision 3D surface metrology more

metrology

At the 2014 MRS Fall Meeting and Exhibit, Bruker introduced the NanoForce Nanoindenting and Nanomechanical Testing System to enable new discoveries in nanoscience. more

mems

Bruker has announced it has recently been awarded its fourth patent for PeakForce Tapping, its proprietary atomic force microscopy mode. more

metrology

Bruker has announced the release of Inspire, the first integrated SPM infrared system for 10-nanometer spatial resolution in chemical and materials property mapping. more

metrology

Bruker has announced the release of the Dektak XTL Stylus Profiler, extending its industry-leading stylus profilometry capabilities to 200 and 300 millimeter semiconductor wafer fabs and next-generation touch panel manufacturers. more

metrology

Bruker has announced that it has launched the ContourSP large panel metrology system. more

metrology

Bruker’s Nano Surfaces division has announced that it has shipped the first unit of the newly redesigned Universal Mechanical Tester (UMT) to the Nano Mechanics and Tribology Laboratory (NMTL) at the University of Arkansas. more

metrology

Bruker has announced the release of the Dimension Icon SSRM-HR, a new atomic force microscope configuration including the Scanning Spreading Resistance Microscopy module, designed specifically for high-resolution semiconductor characterisation. more

metrology