metrology
OGP Introduces SmartScope E18 High-Capacity Benchtop Video Measurement System
Compact, fully automatic 3-axis system delivers expanded XY measuring range for manufacturers with limited floor space
Sep 14, 2026
Yokogawa Optical Spectrum Analyser Supports Ultra-Compact Visible-Laser Validation and Quality Control at Integrated Optics
Visible-range lasers are used in applications where spectral quality, stability and repeatability are critical. In microscopy, spectroscopy, flow cytometry, quantum technologies and LiDAR,
Sep 2, 2026
HBK Expands Displacement Sensor Portfolio
Inductive displacement sensors now available with IO-Link or traditional industrial interfaces
Aug 18, 2026
Wooptix Installs First Phemet® Metrology System at CEA-Leti
Represents Wooptix’s first production deployment and establishes long-term collaboration with one of the world’s leading semiconductor R&D ecosystems
Jul 2, 2026
New 0.6X Objective Enhancing Surface Topography
Measuring both microstructures and large-area form parameters in one
Jun 3, 2026
Metrologic DCS Launches Inspection Flow, a Unified Platform for Manufacturing Intelligence
Metrologic DCS announces the launch of Inspection Flow, a metrology intelligence platform designed to connect and contextualize inspection data across manufacturing lifecycle processes.
Apr 22, 2026
FARO CREAFORM Cuts Laser Line Probe Time to Data on Challenging Surfaces
Helping manufacturers improve inspection, reverse engineering, and quality workflows when scanning dark, shiny, and high‑contrast parts, while reinforcing Quantum X FaroArm and 8‑Axis Max workflows.
Apr 20, 2026
