The brochure "Nanopositioning for Microscopy" provides a comprehensive overview of PI's positioning solutions for microscopy.
In microscopy, the exact positioning of samples and objectives is a prerequisite for reliably obtaining interpretable image data. In the new brochure "Nanopositioning for Microscopy", PI (Physik Instrumente) provides an overview of relevant positioning solutions based on numerous application examples.
From routine microscopy, through high-resolution microscopy, to particle beam and atomic force microscopy: Everywhere, the positioning of samples - static or dynamic - plays a decisive role in the quality of microscope images and their interpretation. In addition to positioning the sample with up to six degrees of freedom, it is often necessary to move the objective in the Z direction.
PI has an extensive product portfolio, based on various drive technologies such as piezo or motor drives, on offer for these tasks therefore making precise positioning down to the nanometer with high repeatability possible. PI's new brochure "Nanopositioning for Microscopy" now provides a clear overview of its product portfolio relating to numerous microscopy techniques. This overview is supplemented by newly designed product finders for sample positioning, Z nanopositioning, and new configuration diagrams for PIFOC® objective scanners, including information on suitable controllers. The digital, PDF version of the brochure also provides direct access to the corresponding PI web pages with detailed product data.
Further information and a download link for the brochure can be found in the PI Blog at Precise Positioning of Samples and Objectives