With over 20 years of innovation in surface metrology, Keyence has combined several innovative technologies into an all in one 3D measurement tool for both shape and surface analysis. The VK-X Series is a non-contact metrology system designed to provide nanometer-level profile, roughness, and film thickness measurements on any type of material. The system is 12 times faster than conventional laser microscopes and capable of measuring an area 16 times larger.
Unlike typical 3D measurement systems, which can struggle with measuring certain materials (transparent, matte, etc.) or surfaces with curved or steep slopes, the VK-X1000 is able to analyze objects regardless of material or shape. Additionally, a 0.5 nm linear scale and NIST traceable calibration ensure that measurements are tied to international standards. This system also now incorporates Focus Variation, an ISO 25178 compliant measurement method that’s capable of measuring larger areas faster.
In order to simplify the operation of collecting surface data, the AI-SCAN function was developed to automate the scanning process. Users simply place their sample on the stage click a single button. The system will automatically determine the optimum settings to use and begin measuring the surface. Even inexperienced users can quickly and easily obtain accurate measurement data and high-resolution images.
The VK-X1000 is also highly-flexible, being able to accommodate parts of practically any size. The measurement head can be raised to measure taller objects, or the head can be mounted onto a custom stage or gantry system for near limitless applications. A motorized lens turret houses up to six dedicated measurement lenses that can be utilized and controlled automatically through the software.
Several features have been added to automate and program the VK-X Series. Teaching lets users program the microscope to travel to user-specified locations to collect data, eliminating the need for operators to manually measure each area separately. The post-processing Analysis software provides advanced measurement capabilities and is able to compare two samples or sample sets across 42 roughness parameters, providing a clear analysis of how two samples differ. Batch processing uniformly applies measurement conditions across many parts, saving time and increasing repeatability.
For more information, please go to: www.keyence.com/vkx1000pr